Innehållsförteckning
Oscillation Control in Dynamic SPM with Quartz Sensors.- Atomic Force Microscope Cantilevers Used as Sensors for Monitoring Microdrop Evaporation.- Mechanical Diode-Based Ultrasonic Atomic Force Microscopies.- Contact Atomic Force Microscopy: A Powerful Tool in Adhesion Science.- Contact Resonance Force Microscopy Techniques for Nanomechanical Measurements.- AFM Nanoindentation Method: Geometrical Effects of the Indenter Tip.- Local Mechanical Properties by Atomic Force Microscopy Nanoindentations.- Thermal Activation Effects in Dynamic Force Spectroscopy and Atomic Friction.
Köp den här e-boken och få 1 till GRATIS!
Språk Engelska ● Formatera PDF ● Sidor 236 ● ISBN 9783540850373 ● Filstorlek 15.7 MB ● Redaktör Bharat Bhushan & Harald Fuchs ● Utgivare Springer Berlin ● Stad Heidelberg ● Land DE ● Publicerad 2008 ● Nedladdningsbara 24 månader ● Valuta EUR ● ID 5238393 ● Kopieringsskydd Social DRM