Bharat Bhushan & Harald Fuchs 
Applied Scanning Probe Methods XI [PDF ebook] 
Scanning Probe Microscopy Techniques

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Oscillation Control in Dynamic SPM with Quartz Sensors.- Atomic Force Microscope Cantilevers Used as Sensors for Monitoring Microdrop Evaporation.- Mechanical Diode-Based Ultrasonic Atomic Force Microscopies.- Contact Atomic Force Microscopy: A Powerful Tool in Adhesion Science.- Contact Resonance Force Microscopy Techniques for Nanomechanical Measurements.- AFM Nanoindentation Method: Geometrical Effects of the Indenter Tip.- Local Mechanical Properties by Atomic Force Microscopy Nanoindentations.- Thermal Activation Effects in Dynamic Force Spectroscopy and Atomic Friction.

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Bahasa Inggris ● Format PDF ● Halaman 236 ● ISBN 9783540850373 ● Ukuran file 15.7 MB ● Editor Bharat Bhushan & Harald Fuchs ● Penerbit Springer Berlin ● Kota Heidelberg ● Negara DE ● Diterbitkan 2008 ● Diunduh 24 bulan ● Mata uang EUR ● ID 5238393 ● Perlindungan salinan DRM sosial

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