Tabela de Conteúdo
Oscillation Control in Dynamic SPM with Quartz Sensors.- Atomic Force Microscope Cantilevers Used as Sensors for Monitoring Microdrop Evaporation.- Mechanical Diode-Based Ultrasonic Atomic Force Microscopies.- Contact Atomic Force Microscopy: A Powerful Tool in Adhesion Science.- Contact Resonance Force Microscopy Techniques for Nanomechanical Measurements.- AFM Nanoindentation Method: Geometrical Effects of the Indenter Tip.- Local Mechanical Properties by Atomic Force Microscopy Nanoindentations.- Thermal Activation Effects in Dynamic Force Spectroscopy and Atomic Friction.
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Língua Inglês ● Formato PDF ● Páginas 236 ● ISBN 9783540850373 ● Tamanho do arquivo 15.7 MB ● Editor Bharat Bhushan & Harald Fuchs ● Editora Springer Berlin ● Cidade Heidelberg ● País DE ● Publicado 2008 ● Carregável 24 meses ● Moeda EUR ● ID 5238393 ● Proteção contra cópia DRM social