Tabella dei contenuti
Oscillation Control in Dynamic SPM with Quartz Sensors.- Atomic Force Microscope Cantilevers Used as Sensors for Monitoring Microdrop Evaporation.- Mechanical Diode-Based Ultrasonic Atomic Force Microscopies.- Contact Atomic Force Microscopy: A Powerful Tool in Adhesion Science.- Contact Resonance Force Microscopy Techniques for Nanomechanical Measurements.- AFM Nanoindentation Method: Geometrical Effects of the Indenter Tip.- Local Mechanical Properties by Atomic Force Microscopy Nanoindentations.- Thermal Activation Effects in Dynamic Force Spectroscopy and Atomic Friction.
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Lingua Inglese ● Formato PDF ● Pagine 236 ● ISBN 9783540850373 ● Dimensione 15.7 MB ● Editore Bharat Bhushan & Harald Fuchs ● Casa editrice Springer Berlin ● Città Heidelberg ● Paese DE ● Pubblicato 2008 ● Scaricabile 24 mesi ● Moneta EUR ● ID 5238393 ● Protezione dalla copia DRM sociale